The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2003

Filed:

Aug. 17, 2001
Applicant:
Inventors:

Takahiko Hashidzume, Osaka, JP;

Yoshinori Odake, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 7/00 ; G11C 1/604 ;
U.S. Cl.
CPC ...
G11C 7/00 ; G11C 1/604 ;
Abstract

A circuit for testing a nonvolatile semiconductor memory includes a serial connection of flash memory cells as a first memory group. In the serial connection, the gates of the flash memory cells have been connected to each other, and a first one of the cells has its source or drain connected to the source or drain of a second one of the cells when the first and second cells are adjacent to each other.


Find Patent Forward Citations

Hashidzume, Takahiko. (2003). Nonvolatile semiconductor memory test circuit and method, nonvolatile semiconductor memory and method for fabricating nonvolatile semiconductor memory (U.S. Patent No. 6538937). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6538937

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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