The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2003
Filed:
Nov. 12, 1999
Shigeru Sugamori, Santa Clara, CA (US);
Advantest Corp., Tokyo, JP;
Abstract
A semiconductor test system having a plurality of different types of tester modules for testing a mixed signal integrated circuit (IC) having analog signals and digital signals with high speed and high efficiency. The semiconductor test system includes two or more tester modules whose performances are different from one another, a test head to accommodate the two or more tester modules, means provided on the test head for electrically connecting the tester modules and a device under test, an optional circuit corresponding to the device under test when the device under test is a mixed signal IC, and a host computer for controlling an overall operation of the test system. Each event tester module includes a tester board which is configured as an event based tester.