The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2003

Filed:

Dec. 03, 1999
Applicant:
Inventors:

Camiel Heffels, Gernsheim, DE;

Thomas Beuermann, Mannheim, DE;

Matthias Rädle, Weisenheim, DE;

Benno Sens, Neustadt, DE;

Alfred Rennig, Böchingen, DE;

Jürgen Ettmüller, Hassloch, DE;

Assignee:

BASF Aktiengesellschaft, Ludwigshafen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/00 ;
U.S. Cl.
CPC ...
G01J 3/00 ;
Abstract

The disclosure is a probelike apparatus ( ) for spectroscopic analysis of a fluid medium ( ) by attenuated reflection. Two light beams from a light source ( ) impinge upon the boundary ( ) between a prism ( ) and the medium ( ) to be analyzed and the intensities of the light beams reflected at the boundary are measured in a detector unit ( ). The two light beams differ in their angle of incidence on the boundary and/or in their polarization state. Measurement is preferably carried out under total reflection.


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