The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 04, 2003
Filed:
Oct. 19, 2000
Karthik Vasanth, Richardson, TX (US);
Shian-Wei Aur, Plano, TX (US);
E. Ajith Amerasekera, Plano, TX (US);
Sharad Saxena, Richardson, TX (US);
Joseph C. Davis, Allen, TX (US);
Richard G. Burch, McKinney, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
An operational lifetime, and also performance characteristics, can be accurately predicted for an experimental transistor design ( ) and a specified set of fabrication process conditions ( ), without actually fabricating and testing a physical transistor made according to the particular design data and process conditions. With respect to the prediction of an operational lifetime, the operational lifetime can be expressed as a function of the size of a gate overlap ( ) of the transistor, and this relationship is valid throughout a selected semiconductor technology for which the transistor is designed. The size of the gate overlap is determined by selecting a combinations of values for two process conditions.