The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2003
Filed:
Jan. 16, 2001
Applicant:
Inventors:
Yoshiyuki Omori, Kure, JP;
Ryosuke Watanabe, Kure, JP;
Atsushi Tsuruta, Kure, JP;
Syuuzou Ueno, Kure, JP;
Hideki Shindo, Kure, JP;
Assignee:
Mitutoyo Corporation, Kawasaki, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 1/508 ;
U.S. Cl.
CPC ...
G01B 1/508 ;
Abstract
An eccentricity adjusting motor ( ) is provided in eccentricity adjusting device ( ) that adjusts an eccentricity in a work. A tilt adjusting motor ( ) is also provided in tilt adjusting device ( ) that adjusts a tilt of the work. A processor ( ) computes the eccentricity and tilt of the work, based on which eccentricity/tilt compensating means ( ) control the motors ( ) to compensate the eccentricity and tilt of the work.
Omori, Yoshiyuki. (2003). Method and apparatus for measuring roundness (U.S. Patent No. 6526364). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6526364
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile