The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2003

Filed:

Apr. 24, 2002
Applicant:
Inventors:

Gary W. Griffin, San Jose, CA (US);

Myngoc T. Nguyen, San Jose, CA (US);

Gary A. Wells, Fremont, CA (US);

Carl R. Gore, San Jose, CA (US);

John W. Joy, Paradise, CA (US);

Chris A. Shmatovich, Oroville, CA (US);

Assignee:

NPTest, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/102 ;
U.S. Cl.
CPC ...
G01R 3/102 ;
Abstract

A test system includes (a) a tester mechanism ( and ) having tester contacts ( ) for carrying test signals, (b) an interface module ( ), and (c) a device-side board ( ) having device-side contacts ( ) for connection to external leads of an electronic device ( ) under test. The interface module contains a tester-side body ( ) having tester-side openings ( ) for being positioned opposite the tester contacts, a device-side body ( ) having device-side openings ( ) for being positioned opposite the device-side contacts, and interface conductors ( ) extending through the tester-side and device-side openings for connecting the tester contacts to the device-side contacts. The tester body is configured, typically as at least five wedge-shaped portions ( ), in such a manner as to enable the electronic device under test to have an increased number of external leads.


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