The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2003
Filed:
Oct. 10, 2000
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
A low-cost semiconductor tester which saves memory space for storing a test pattern by means of producing a high-speed clock while preparing a test pattern at a low-speed test cycle and which has a test-pattern storage circuit of small storage capacity, as well as a semiconductor test method using the semiconductor tester. The semiconductor tester includes a reference-signal-generation circuit for producing a test cycle to be taken as a reference-signal, a waveform formation circuit for producing the geometry of an output waveform on the basis of the test cycle, and a waveform output circuit which sets the voltage of the geometry of the output waveform and applies the voltage to a semiconductor element to be measured. A ring oscillation circuit is provided in the waveform formation circuit and has a variable delay circuit. The ring oscillation circuit converts the output waveform, which waveform is produced at a predetermined timing, into a high-speed clock waveform.