The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2003

Filed:

Jan. 29, 2001
Applicant:
Inventors:

Toshifumi Watanabe, Tokyo, JP;

Akihiko Ando, Tokyo, JP;

Yuichi Miyaji, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 2/312 ; H03D 1/300 ; G06F 1/900 ;
U.S. Cl.
CPC ...
G01R 2/312 ; H03D 1/300 ; G06F 1/900 ;
Abstract

A signal to be measured is waveform-formatted to a square waveform that retains the frequency, duty ratio and jitter component of the original signal, and the leading (or trailing) edge of the waveform-formatted output is sampled by a sampling clock of a frequency slightly different from 1/N of the frequency f of the signal to be measured. The samples are converted by an A/D converter to digital data V (t), which is stored in a memory. The difference between the stored digital data V (t) and the rise-up characteristic line V′(t) is calculated to detect jitter J′ (t).


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