The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2003

Filed:

Jun. 20, 2000
Applicant:
Inventor:

Toshiharu Miyata, Kawasaki, JP;

Assignee:

Mitutoyo Corporation, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/34 ;
U.S. Cl.
CPC ...
G01D 5/34 ;
Abstract

A linear scale type measuring device capable of canceling an error caused by inclination of an encoder, a moire error, is disclosed. A linear encoder disposed relative to a scale includes two sensors A and B which are arranged such that they are inclined at a predetermined angle &thgr; with regard to the scale. At the time of measurement, a detection value corresponding to that with no inclination can be obtained by an operation based on detection values from the sensors A and B, and the known angle &thgr;, even when the encoder is further inclined by any angle &dgr;.


Find Patent Forward Citations

Miyata, Toshiharu. (2003). Linear scale measuring device and position detection method using the same (U.S. Patent No. 6521885). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6521885

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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