The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 18, 2003
Filed:
Dec. 27, 2000
Katrina Mikhaylichenko, San Jose, CA (US);
Vladislav Yakovlev, Milwaukee, WI (US);
Mike Ravkin, Sunnyvale, CA (US);
John M. de Larios, Palo Alto, CA (US);
Lam Research Corporation, Fremont, CA (US);
Abstract
Methods for evaluating advanced wafer drying techniques are provided. An exemplary method includes applying a solution containing an analytically detectable compound to a substrate prior to a desired drying operation. The method then provides for the inspection and analysis of the substrate for any residue of the analytically detectable compound, the presence of which identifies any regions of the substrate where the drying operation is ineffective. The drying operation is selected, changed, or modified according to the results of the evaluation.