The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2003
Filed:
Oct. 06, 2000
Applicant:
Inventors:
Scott Manalis, Santa Barbara, CA (US);
Emily B. Cooper, Cambridge, MA (US);
Calvin F. Quate, Stanford, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 ;
U.S. Cl.
CPC ...
G11B 7/00 ;
Abstract
An atomic force microscope (AFM) tipped with a single-wall conductive nanotube is operated to write bits onto a metal substrate by oxidizing the surface. The oxidized microregions project above an otherwise flat surface, and can therefore be detected—that is, the written bits can be read—using the same AFM arrangement.
Manalis, Scott. (2003). High-density data storage using atomic force microscope (U.S. Patent No. 6519221). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6519221
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile