The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 11, 2003
Filed:
Jul. 10, 2001
Eiji Kimura, Saitama, JP;
Motoki Imamura, Saitama, JP;
Advantest Corporation, Tokyo, JP;
Abstract
An apparatus for measuring optical characteristics includes a variable-wavelength light source for generating a variable-wavelength light, having an identification waveform when the wavelength changes, the identification waveform being distinguishable from a normal waveform before and after the wavelength changes, an optical modulator for modulating the variable-wavelength light at a predetermined frequency and inputting it to an optical fiber; and an identification waveform detector for detecting the identification waveform of light transmitted through the optical fiber, wherein since the identification waveform detector detects when the waveform starts to change, it is possible to obtain synchronization between an incidence side and an exit side of the optical fiber. Accordingly, it is possible to obtain synchronization between an incidence side and an exit side of a device-under-test even if the wavelength of light source is continuously swept, whereby characteristics such as chromatic dispersion and the like can be measured.