The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2003
Filed:
Jul. 26, 2000
Paul Pfaff, Portland, OR (US);
Kevin L. Russell, Portland, OR (US);
Other;
Abstract
A method of testing a device under test includes providing a beam of coherent light from a light source having a first wavelength, and imposing the beam of light on a test device over a spatial region within the test device substantially greater than the first wavelength, wherein the test device has a first state of birefringence. A second beam of light is imposed on the test device over a spatial region within the test device substantially greater than the first wavelength, wherein the test device has a second state of birefringence. Data representative of the interference of the first beam and the second beam within the bulk of the device under test is obtained representative of the voltages within the region
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile