The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 28, 2003
Filed:
Oct. 10, 2001
Applicant:
Inventors:
Yuwu Zhang, Kawasaki, JP;
Masaoki Yamagata, Kawasaki, JP;
Yoichi Toida, Kawasaki, JP;
Shiro Igasaki, Kawasaki, JP;
Eiichi Tsunoda, Kawasaki, JP;
Assignee:
Mitutoyo Corporation, Kawasaki, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 2/102 ;
U.S. Cl.
CPC ...
G01B 2/102 ;
Abstract
A gage inspecting apparatus includes a jog dial A for controlling an amount of displacement of a measuring spindle at a time when the position of the measuring spindle is finely adjusted, and a shuttle ring B for controlling the driving direction and driving speed of the measuring spindle at a time when the position of the measuring spindle is roughly adjusted. The relationship between the amount of rotation of the jog dial A and the amount of displacement of the measuring spindle can be set in correspondence with a scale interval of the gage.