The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2002
Filed:
Mar. 01, 2001
Naoya Kikuchi, Kawasaki, JP;
Hirokazu Michiwaki, Kawasaki, JP;
Mitutoyo Corporation, Kawasaki, JP;
Abstract
A distribution of sample points, which are obtained by a two or three-dimensional coordinate measuring machine, is examined to classify into zero through third degrees. A geometry element is discriminated on the basis of the distribution of the sample points (zero through third degrees) and the number of the sample points. When the number of the sample points is equal to 2 or more and the distribution of the sample points is of the second degree, the geometry element can be discriminated as a plane or a circle in consideration of the probe moving direction. When the number of the sample points is equal to 6 or more, the geometry element can be discriminated as a cylinder or a circular cone on the basis of calculation of a half vertical angle of a circular cone that is specified from the sample points.