The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 2002
Filed:
Apr. 02, 2001
G. Dickey Arndt, Friendswood, TX (US);
James R. Carl, Houston, TX (US);
Kent A. Byerly, Seabrook, TX (US);
Phong H. Ngo, Friendswood, TX (US);
Larry G. Stolarczyk, Raton, NM (US);
Abstract
Apparatus and methods are disclosed for detecting anomalies in microwave penetrable material that may be used for locating plastic mines or pipes underneath the ground. A transmitter is positioned at a plurality of different positions above the ground. A microwave signal is transmitted that is stepped over a plurality of frequencies. At each position, a plurality of reflections are received corresponding to each of the plurality of frequencies that were transmitted. A complex target vector may be produced at each position that contains complex values corresponding to magnitude, phase, and time delay for each of the plurality of reflections received at that location. A complex reference data vector may be produced, either based on predetermined values or based on data from the received plurality of reflections. A comparison is made between the complex target vector and the complex reference data vector to produce a channel vector. In one embodiment, an operator may be applied to the channel vector such as a complex filter matrix or to add a complex conjugate. A response signal is produced and anomalies are detected by variations in the response signal with respect to the plurality of positions.