The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 2002

Filed:

Oct. 30, 2000
Applicant:
Inventors:

Jeffrey A. Shields, Sunnyvale, CA (US);

Jiahua Huang, San Jose, CA (US);

Jean Yee-Mei Yang, Sunnyvale, CA (US);

Assignee:

Advance Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/1302 ;
U.S. Cl.
CPC ...
H01L 2/1302 ;
Abstract

A process for fabricating a semiconductor device, the process includes providing a semiconductor substrate having an oxide-nitride-oxide layer thereon and a patterned resist layer overlying the oxide-nitride-oxide layer, wherein the oxide-nitride-oxide layer includes a first oxide layer, a nitride layer overlying the first oxide layer, and a second oxide layer overlying the nitride layer. The process further includes, performing an isotropic etch on the oxide-nitride-oxide layer to remove a portion of the oxide-nitride-oxide layer.


Find Patent Forward Citations

Shields, Jeffrey. (2002). Method for selective removal of ono layer (U.S. Patent No. 6500768). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6500768

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…