The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2002
Filed:
Jul. 20, 2000
Yoshikazu Nakayama, Tokyo, JP;
Norio Arakawa, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
A network analyzer includes a raw data measuring portion for measuring an S parameter of a device under test, a measuring-system error-factor measuring portion for obtaining measuring-system error factors occurring in the measurement of the device under test, a parameter conversion factor calculating portion for obtaining a parameter conversion factor indicative of the relationship between impedance and measuring system error-factor-free data obtained by eliminating measuring-system error factors from the S parameter, an extended error-factor calculating portion for obtaining extended error factors by combining the measurement-system error factors and the parameter conversion factor, and a device-under-test calculating portion for obtaining the impedance from the S parameter and the extended error factors. Accordingly, the need for fixtures is eliminated and, further, the extended error factors are obtained in advance. Therefore, operation of the network analyzer can be simplified and the calculating speeds increased.