The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 2002

Filed:

Mar. 01, 2000
Applicant:
Inventor:

Nobuhisa Nishioki, Tsukuba, JP;

Assignee:

Mitutoyo Corporation, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract

Displacement detector generates bi-phase sine wave signals S A and S B with a period of P in accordance with a displacement L to be detected. Another displacement detector generates bi-phase sine wave signals S A and S B with a period of P different from the period P in accordance with the displacement L to be detected. Wavelength composing means composes the sine wave signals S A, S A and the cosine wave signals S B, S B output from the displacement detectors and to generate bi-phase sine wave signals, SxA=S A·S B−S B·S A and SxB=S B·S B+S A·S A, with a period of Px equal to the least common multiple between the periods P and P . Then, detecting each phase of a fine resolution signal comprising either of outputs from the displacement detectors and and a coarse resolution signal comprising the output signal from the wavelength composing means , and computing the displacement L as an absolute position within said period Px based on the phase information.


Find Patent Forward Citations

Nishioki, Nobuhisa. (2002). Measuring device for absolute measurement of displacement (U.S. Patent No. 6496266). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6496266

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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