The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2002
Filed:
Apr. 15, 1999
Victor L. Hansen, Portland, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
A method for calibrating an instrument includes maintaining typical response values at respective frequency locations. The response of the instrument being calibrated is measured at a subset of frequency locations in the typical response. Response values for frequency locations not in the subset are estimated from the typical and measured response values. The instrument is calibrated based on the actual and estimated response values. Apparatus for calibrating an instrument includes a signal generator, coupled to the instrument, which generates a signal having known characteristics. A controller, coupled to the instrument, generates a calibration signal. Controller memory stores typical response values at respective frequency locations, and measures response values at a subset of the frequency locations. Response values for frequency locations not in the subset are estimated from the typical and measured response values. The instrument is calibrated in response to the measured and estimated response values.