The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 2002
Filed:
Nov. 17, 2000
Jian-Yu Liu, Hsinchu, TW;
Ming-Yi Lay, Hsinchu, TW;
Winbond Electronics Corp., Hsinchu, TW;
Abstract
A time dependent dielectric breakdown (TDDB) test device is used for testing a dielectric layer to obtain a time to failure (TTF) data, wherein the TDDB test device is electrically connected between a power source and a current detector and the dielectric layer includes at least a first capacitor and a second capacitor formed about selected first and second locations of the dielectric layer. The device includes a first current-limiting apparatus electrically connected to the first capacitor in series, a second current-limiting apparatus electrically connected to the second capacitor in series and the first current-limiting apparatus in parallel, and a voltage-regulating apparatus electrically connected to the second current-limiting apparatus in series. It also provides a method for implementing such device.