The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2002

Filed:

Jun. 20, 1999
Applicant:
Inventor:

Yatin V. Hoskote, Portland, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

One aspect of the invention is a coverage metric to identify that part of a state space which is covered by properties verified by model checking. In each property, a signal is identified (or a proposition on several signals) as the observed signal in that property. The coverage metric measures the coverage of a set of properties with respect to the observed signal. The coverage metric identifies the reachable states in which the value of the observed signal determines the validity of the verified properties. Then a model checking algorithm can be used to check the correctness condition on the observed signal in these “covered” states to prove or disprove the property.


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