The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2002

Filed:

Nov. 27, 2000
Applicant:
Inventor:

William Tom Batchelder, Oakland, CA (US);

Assignee:

Novellus Systems, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
F27B 5/14 ;
U.S. Cl.
CPC ...
F27B 5/14 ;
Abstract

A system and method for thermal curing of substrates are provided. In one example, a pair of vertical furnace tubes are configured with a hot plate positioned between the lower regions of the furnace tubes and connected to each tube by a passageway. A cooling chamber is positioned between the furnace tubes in an upper region and connected to both tubes by an upper passageway. A wafer transport is configured within each furnace tube to transition wafers from the lower region of each tube, through a middle region of each tube, and to the upper region of each tube. A method is provided in which substrates are pre-heated on the hot plate and then transitioned to a slot in the wafer transport in the vertical furnace tube. The wafer transport is indexed one position as additional substrates are pre-heated and transitioned. The substrates are thermally cured and are then transitioned from the wafer transport to the cooling chamber employing a first in/first out process. As substrates are being transitioned out of a wafer transport from one furnace tube, more substrates are being transitioned into the wafer transport of the other furnace tube.


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