The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2002
Filed:
Sep. 14, 2000
Applicant:
Inventor:
Erin D. Spring, Corfu, NY (US);
Assignee:
Leica Microsystems Inc., Depew, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 5/04 ;
U.S. Cl.
CPC ...
G02B 5/04 ;
Abstract
A plurality of magnets is provided in an illumination prism carrier of a transmitted light refractometer and a corresponding plurality of magnets is provided in a sample prism housing of the refractometer to align a light exit surface of the illumination prism relative to a sample surface of the sample prism and urge the optical surfaces together in an even and uniform manner. The magnets replace mechanical biasing arrangements for positioning the optical surfaces and function to consistently reproduce a measurement optical path in the instrument for improved accuracy and repeatability of measurements.