The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2002

Filed:

Jul. 14, 2000
Applicant:
Inventors:

David E. Honigs, Hagerstown, MD (US);

Robert D. Rosenthal, Montgomery Village, MD (US);

Assignee:

Futrex Inc., Gaithersburg, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 ;
U.S. Cl.
CPC ...
A61B 5/00 ;
Abstract

In a method to improve the calibration of a non-invasive, near infrared (NIR) measurement device, a plurality of data terms is formed for the NIR measurement device. Then the codependence of the data terms is evaluated by forming cross-products terms using the data terms. Next, sets of prespecified sizes are randomly formed from the data terms and the cross-product terms. Each of these sets of terms is evaluated by testing the ability of the set to predict a set of accurate measurements using regression analysis. The method then selects one of the sets based on preselected criteria and uses the selected set to calibrate the NIR measurement device.

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