The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2002
Filed:
May. 01, 2000
Linley F. Gumm, Beaverton, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
A quality cause measurement display is formed by generating an ideal digitally modulated RF transmitter signal. A test instrument is used to measure an overall quality measurement for the transmitter signal as well as individual contributions by each transmitter parameter. Each measured parameter is used to modify the ideal transmitter signal, and a quality measure is determined using the quality measurement algorithm. The individual parameter quality measures are compared with the overall quality measurement to determine percentage contribution of each parameter to the overall quality measurement. From the percentage contribution an operator may understand what is causing problems in the transmitter signal when the overall quality measurement is out of limits.