The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2002
Filed:
Jun. 28, 1999
Applicant:
Inventor:
Arthur E. LeColst, Moorpark, CA (US);
Assignee:
Teradyne, Inc., Boston, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/126 ; G01R 3/102 ; H01H 3/102 ;
U.S. Cl.
CPC ...
G01R 3/126 ; G01R 3/102 ; H01H 3/102 ;
Abstract
A semiconductor parallel tester is disclosed for simultaneously testing a plurality of DUTs secured to a handling apparatus. The test system includes a system controller for initiating system test signals and a pin electronics assembly responsive to the system test signals to generate test pattern signals for application to the plurality of DUTs. The system further includes a signal interface defining a plurality of direct signal paths between the handling apparatus and the pin electronics assembly.