The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2002

Filed:

Jun. 16, 1999
Applicant:
Inventors:

Kazutoshi Wakao, Hyogo, JP;

Akinobu Teramoto, Hyogo, JP;

Masahiko Fujisawa, Hyogo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/9792 ; H01L 2/9788 ; H01L 2/7115 ;
U.S. Cl.
CPC ...
H01L 2/9792 ; H01L 2/9788 ; H01L 2/7115 ;
Abstract

A semiconductor device capable of suppressing increase in the junction leakage current and preventing deterioration in the electric characteristics even when the device is miniaturized, and a method of manufacturing thereof are attained. The semiconductor device includes a semiconductor substrate, an isolation insulator, a gate electrode, a coating film, an interlayer insulation film, and a sidewall coating film. The semiconductor substrate has a main surface. The isolation insulator is formed at the main surface of the semiconductor substrate and isolates a conductive region. The gate electrode is formed in the conductive region. The coating film is formed on the isolation insulator, and it has a sidewall and a film thickness of at most that of the gate electrode. The interlayer insulation film is formed on the coating film. The sidewall coating film is formed on the sidewall of the coating film, and it includes a material having an etching rate different from that of the interlayer insulation film.


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