The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2002
Filed:
Dec. 31, 1999
Harold R. Garner, Flower Mound, TX (US);
Jonathan D. Wren, Irving, TX (US);
John D. Minna, Dallas, TX (US);
John W. Fondon, III, Dallas, TX (US);
Board of Regents, The University of Texas System, Austin, TX (US);
Abstract
The invention provides computational methods and compositions for identifying polymorphic repeats in genes. Candidate polymorphic repeats are identified by detecting tandem repeats in a target coding sequence, scoring the repeats for polymorphic probability, and generating a dataset correlating the repeats with polymorphic probability. Actual polymorphic repeat are identified by further detecting the candidate polymorphic repeat in each of a population of different coding sequences, and determining whether the candidate polymorphic repeat is polymorphic in the population. Computationally derived polymorphic repeats are validated with phenotypic variations and these correlates are used to detect the presence or absence of such phenotypic variation in test genes. Variances at polymorphic repeats are identified by detecting in a test gene or coding region the presence or absence of variance at a disclosed unconventional polymorphic repeat.