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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6470238 B1

PDFFull Text
Date of Patent:
Oct. 22, 2002

Filed:

Jun. 17, 1999

Method and apparatus to control device temperature

Applicant:
Inventors:

Puthiya K. Nizar, El Dorado Hills, CA (US);

David J. McDonnell, Fair Oaks, CA (US);

Brian K. Langendorf, El Dorado Hills, CA (US);

Michael G. LaTondre, Fair Oaks, CA (US);

Jeff L. Rabe, Gold River, CA (US);

Tom A. Sutera, Folsom, CA (US);

Zohar Bogin, Folsom, CA (US);

Vincent E. VonBokern, Rescue, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:

Blakely, Sokoloff, Taylor & Zafman LLP

Primary Examiner:

Leo Picard

Assistant Examiner:

Kidest Bahta

Int. Cl.
CPC ...
G05D 2/300 ;
U.S. Cl.
CPC ...
G05D 2/300 ;
Abstract

A method for controlling device temperature. The method involves determining access rate to a component, comparing the access rate with a predetermined threshold modified by a weighted value and controlling the temperature of the component through corrective action.

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Nizar, Puthiya. (2002). Method and apparatus to control device temperature (U.S. Patent No. 6470238). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6470238

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