The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2002
Filed:
Oct. 14, 1999
Applicant:
Inventors:
Toshiaki Kurihara, Tokyo, JP;
Michiaki Arai, Tokyo, JP;
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 2/710 ;
U.S. Cl.
CPC ...
H04L 2/710 ;
Abstract
The offset QPSK modulation analytic system capable of estimating the initial phase of an offset QPSK modulated signal is disclosed. For each of a plurality of candidate values for the initial phase, the correlation coefficient between a signal whose clock delay has been estimated and compensated and an ideal signal generated based on the signal is computed, and the candidate value having the maximum value of the computed correlation coefficient is estimated as the optimum initial phase.
Kurihara, Toshiaki. (2002). Offset qpsk modulation analytic system (U.S. Patent No. 6470056). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6470056
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile