The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2002
Filed:
Jan. 08, 2001
John J. Bush, Leander, TX (US);
Mark I. Gardner, Cedar Creek, TX (US);
David E. Brown, Austin, TX (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
Various embodiments of a test circuit and methods of fabricating and using the same are provided. In one aspect, a test circuit includes a semiconductor substrate and a mask thereon that has an opening to enable impurity doping of selected portions of the test circuit. A plurality of circuit devices are provided on the substrate that have respective active regions positioned at staggered known distances from the mask opening. Each of the plurality of circuit devices has a gate electrode that extends to the opening and has a first impurity region of a first conductivity type and a second impurity region of a second and opposite conductivity type. Where the predicted on-state output current of a given circuit device exceeds an actual output current of the given circuit device, there is indication of an overlap between the first and second impurity regions of the gate electrode of the given device.