The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2002
Filed:
Mar. 17, 2000
Tohru Kasai, Tokyo, JP;
JEOL Ltd., Tokyo, JP;
Abstract
A specimen holder support device for use with an electron microscope. The specimen holder support device alleviates atmospheric pressure (back pressure) applied via a specimen holder to a holder inner end-positioning drive mechanism for placing the inner end of a specimen holder in position. The specimen holder has a guide pin. The specimen holder support device comprises a holder mounting member, a slider, a slider-arresting member, and a spring, together with the holder inner end-positioning drive mechanism. The holder mounting member is formed at the outer end of a swinging member so as to extend axially, and has a slider-receiving hole into which the guide pin of the specimen holder protrudes. The holder inner end-positioning drive mechanism abuts against the specimen holding portion of the specimen holder and moves the specimen holding portion axially, thus placing the specimen holding portion in position. The slider has a pin engagement portion and an arrested portion for movement limitation. The pin engagement portion is received in the slider-receiving groove and engages the guide pin. The slider-arresting member has a slider-arresting portion for arresting the arrested portion from the side of the inner end. The spring biases the slider-arresting member to limit movement of the slider toward the inner end.