The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 08, 2002

Filed:

Sep. 22, 2000
Applicant:
Inventors:

Kenichi Komiya, Kawasaki, JP;

Koji Tanimoto, Kawasaki, JP;

Toshimitsu Ichiyanagi, Zushi, JP;

Jun Sakakibara, Tokyo, JP;

Koji Kawai, Fujisawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/608 ;
U.S. Cl.
CPC ...
G02B 2/608 ;
Abstract

A pair of sensor patterns detect a passage position in a sub-scan direction of a light beam scanned over a surface of a photosensitive drum. The sensor patterns have, for example, trapezoidal shapes and are disposed symmetrical at a position equivalent to a position of the surface to be scanned. The sensor patterns are juxtaposed in a scan direction of the light beam at a predetermined interval therebetween. An output integration value from one of the paired photodetector elements successively increases while an output integration value from the other photodetector element successively decreases in relation to a variation of a passage position of the light beam in the sub-scan direction. On the basis of a difference between the output integration values of the paired sensor patterns, the passage position of the light beam in the sub-scan direction is detected.


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