The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6459756 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 01, 2002

Filed:

Oct. 30, 2001
Applicant:
Inventors:

Kwok Tam, Edison, NJ (US);

Günter Lauritsch, Erlangen, DE;

Herbert Bruder, Höchstadt, DE;

Assignee:

Siemens Corporate Research, Inc., Princeton, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 ;
U.S. Cl.
CPC ...
A61B 6/03 ;
Abstract

A system and method for 3D image reconstruction in a spiral scan cone beam computed tomography (CT) imaging system that allows the pitch of spiral scan projection to be reduced by a factor of 1/n (where n&equals;3, 5, 7, 9, etc), thereby increasing the x-ray dosage to obtain a higher S/N (signal-to-noise) ratio, while achieving efficient use of a fixed-size detector. In addition, an image reconstruction protocol computes a correction factor for integration planes that intersect the reduced-pitch spiral path (which surrounds a ROI) at only M<n locations within an angular range that is determined, e.g., for M&equals;1 planes, based on mask boundaries applied to the cone beam data. Despite the reduced pitch, the M<n integration planes do not provide increased flux (in contrast to other integration planes that intersect the object and scan path in M&exist;n locations).


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