The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2002
Filed:
Feb. 26, 1999
Akihiko Ito, Hanyu, JP;
Yoshihito Kobayashi, Gyoda, JP;
Yoshiyuki Masuo, Gyoda, JP;
Tsuyoshi Yamashita, Gunma, JP;
Advantest Corporation, Tokyo, JP;
Abstract
An IC tester which is capable of reducing the time required before completion of testing on all of ICs to be tested is provided. The depth (length in the Y-axis direction) of the constant temperature chamber and the exit chamber is expanded by a dimension corresponding approximately to one transverse width (length of the minor edge) of the rectangular test tray and two generally parallel test tray transport paths or alternatively a widened test tray transport path broad enough to transport two test trays simultaneously with the two test trays juxtaposed in a direction transverse to the widened test tray transport path are provided in the section of test tray transport path extending from the soak chamber in the constant temperature chamber through the testing section in the constant temperature chamber to the exit chamber so that two test trays may be simultaneously transported along the two test tray transport paths or the widened test tray transport path.