The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2002

Filed:

Mar. 30, 2001
Applicant:
Inventor:

Cheng-Wei Lee, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/1283 ;
U.S. Cl.
CPC ...
H01L 2/1283 ;
Abstract

A method for forming aluminum bumps that has significantly reduced processing steps than the conventional method is disclosed. The method utilizes a chemical vapor deposition technique for the selective deposition of aluminum into an opening for forming the bump and then a wet etch process for removing a polyimide layer that functioned both as a photoresist layer for providing an opening in a passivation layer and as a support for a via hole during the selective aluminum deposition process. The thickness of the passivation layer and the polyimide layer formed on top of the metal I/O pad is important since it determines the height of the aluminum bump formed.


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