The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2002
Filed:
Mar. 28, 2001
Kuang-Shyr Wu, Taoyuan Hsien, TW;
Maw-Ching Lin, Taoyuan Hsien, TW;
Li-Shen Juhn, Taoyuan Hsien, TW;
Chung-Shan Institute of Science and Technology, Taoyuan, TW;
Abstract
A radiation test system that couples with a radiation test field and a radiation controller. The radiation controller records the flow of radiation particles and the test results obtained from a test component. The radiation controller also controls a radiation particle accelerator so that the test component is irradiated with a cyclically varying radiation beam. The radiation test system further includes a daughter board, a motherboard, a power source, a near-end monitor and a far-end monitor. The near-end monitor is responsible for initiating a test program to test the test program, monitoring the test status and recording the test data. The far-end monitor remotely controls the near-end monitor to initiate an irradiation testing of the test component. The far-end monitor also receives test data submitted by the near-end monitor so that test results may be further analyzed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile