The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2002
Filed:
Dec. 17, 1999
Naoaki Aoki, Austin, TX (US);
Sang Hoo Dhong, Austin, TX (US);
Joel Abraham Silberman, Somers, NY (US);
Osamu Takahashi, Round Rock, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system and method for ensuring comprehensive testing coverage of components within a dynamic logic macro during a burn-in test cycle. Burn-in testing is initiated within dynamic logic circuit having a dynamic logic block and a self-reset loop for generating a reset signal. A multiple phase burn-in test input is applied to the self-reset loop for modifying the duration of the reset signal during burn-in testing, such that the components within the dynamic logic macro are adequately stressed during the burn-in test cycle.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile