The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 10, 2002
Filed:
Jul. 10, 2000
Applicant:
Inventor:
Peter L. Hansen, Peabody, MA (US);
Assignee:
Teradyne, Inc., Boston, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/128 ;
U.S. Cl.
CPC ...
G01R 3/128 ;
Abstract
A flexible test environment for automatic test equipment, whereby sequences of steps for developing and executing test programs are specified using hierarchical trees of nodes. The nodes in one tree include end leaves that correspond with the test program development steps, and the nodes in another tree include end leaves that correspond with the test program execution steps. Further, the end leaves in both trees have a plurality of associated properties, which are used for specifying test program flow and for indicating methods to be called when the steps are executed. The test environment can be easily adapted to a distributed tester architecture.