The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 10, 2002

Filed:

Nov. 20, 2000
Applicant:
Inventors:

Clinton O. Fruitman, Chandler, AZ (US);

Timothy S. Dyer, Tempe, AZ (US);

Assignee:

SpeedFam-IPEC Corporation, Chandler, AZ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B24B 4/903 ;
U.S. Cl.
CPC ...
B24B 4/903 ;
Abstract

The invention is a chemical-mechanical polishing wafer carrier that is able to apply a plurality of different pressures, with minimal discontinuities at the interfaces between different pressures, through a diaphragm to a back surface of a wafer. A plurality of concentric balloons, that may be individually pressurized, is used to support and press on the back surface of the diaphragm. The walls of the balloons are preferably thin and elastic and preferably do not attach to the diaphragm. This helps to minimize any pressure discontinuities on the diaphragm along the interfaces between the balloons. A wafer may be placed against the front surface of the diaphragm allowing the front surface of the diaphragm to retain and press against the back surface of the wafer during a planarization process.


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