The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 03, 2002
Filed:
Jan. 07, 1999
Applicant:
Inventors:
Ara Markosian, Cupertino, CA (US);
Yaacov (Jacob) Greidinger, Cupertino, CA (US);
Siu-Tong Hui, San Jose, CA (US);
Sedrak Sargisian, Sunnyvale, CA (US);
Assignee:
Monterey Design Systems, Inc., Sunnyvale, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract
A system is disclosed for compacting an initial electronic layout of cells within an initial layout boundary. The system includes forming paths extending from a bottom edge of the layout to a top edge. The paths intersect cells of the initial layout. The system determines which of the paths are critical paths. Critical cuts are then determined. A critical cut is a cut that severs critical paths. A set of cells associated with a critical cut are removed from the layout and replaced in order to reduce the initial layout boundary.