The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2002

Filed:

Jul. 30, 2001
Applicant:
Inventors:

Chih-Hsing Yu, Hsin-Chu, TW;

Yeur-Luen Tu, Taichung, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/14763 ;
U.S. Cl.
CPC ...
H01L 2/14763 ;
Abstract

Within a method for forming a contact via there is provided a substrate having formed thereover a pair of topographic structures separated by a contact region formed within the substrate. There is then formed upon the substrate and the pair of topographic structures a blanket conformal isolation layer which has formed thereupon a blanket variable thickness masking layer formed thicker over the pair of topographic structures than interposed between the pair of topographic structures. The blanket variable thickness masking layer and the blanket conformal isolation layer are then completely etched through interposed between, but not over, the pair of topographic structures to thus form the contact via. The method is useful for forming bitline contact vias within memory cell structures.


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