The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 27, 2002

Filed:

Sep. 28, 2000
Applicant:
Inventors:

Robert E. Fontana, Jr., San Jose, CA (US);

Jordan A. Katine, San Jose, CA (US);

Ernst Kratschmer, Yorktown Heights, NY (US);

Michael J. Rooks, Briarcliff Manor, NY (US);

Ching H. Tsang, Sunnyvale, CA (US);

Raman Gobichettipalayam Viswanathan, Briarcliff Manor, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03C 5/16 ; G03C 5/56 ;
U.S. Cl.
CPC ...
G03C 5/16 ; G03C 5/56 ;
Abstract

A high-aspect ratio resist profile is obtained using a development process wherein a mixture of an alcohol and water is used as the developer. The alcohol/water mixture is non-toxic, and does not cause excess swelling and cracking of the resist during the development process.


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Fontana, Jr., Robert. (2002). High-aspect ratio resist development using safe-solvent mixtures of alcohol and water (U.S. Patent No. 6440639). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6440639

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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