The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2002

Filed:

Jul. 31, 2000
Applicant:
Inventors:

Stephen Mark Sekel, Camas, WA (US);

Stanley Joseph Sula, Portland, OR (US);

Assignee:

LeCroy Corporation, Beaverton, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/102 ; G01R 1/320 ;
U.S. Cl.
CPC ...
G01R 3/102 ; G01R 1/320 ;
Abstract

The automatic probe identification system of the present invention automatically identifies an electrical test probe as being associated with a particular channel. Specifically, an automatic probe identification system of the present invention includes a testing instrument and at least one test probe. The testing instrument preferably has at least one input channel, each input channel being visually represented by a unique channel identification such as a colored trace. The test probe has a probe identifier such as a full-spectrum LED for selectively visually representing a unique probe channel identification. The probe identifier automatically visually represents a unique probe channel identification corresponding to the unique channel identification of the input channel to which it is coupled. An additional benefit of this system is that the probe identifier used in one preferred embodiment of the test probe provides additional illumination for shadowed or dark places.


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