The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 13, 2002
Filed:
Mar. 31, 1998
Applicant:
Inventors:
Lawrence T. Clark, Phoenix, AZ (US);
Mark A. Beiley, Chandler, AZ (US);
Eric J. Hoffman, Chandler, AZ (US);
Assignee:
Intel Corporation, Santa Clara, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/217 ;
U.S. Cl.
CPC ...
H04N 5/217 ;
Abstract
An architecture for self-calibration and fixed-pattern noise removal in imager chips. The column-to-column fixed pattern noise and/or pixel-to-pixel fixed pattern noise is determined through a self-calibration operation. During operation of the imager chip, when a value of a pixel is read, the read value is compensated with the fixed-pattern noise corresponding to either the column fixed pattern noise corresponding to the column having the pixel from which the value was read or to the pixel fixed pattern noise corresponding to the pixel from which the value was read.