The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2002

Filed:

Jun. 05, 1998
Applicant:
Inventors:

Masahiko Ogino, Hitachi, JP;

Shuji Eguchi, Ibaraki-ken, JP;

Akira Nagai, Hitachi, JP;

Takumi Ueno, Mito, JP;

Masanori Segawa, Hitachi, JP;

Hiroyoshi Kokaku, Hitachi, JP;

Toshiaki Ishii, Hitachi, JP;

Ichiro Anjoh, Koganei, JP;

Asao Nishimura, Kokubunji, JP;

Chuichi Miyazaki, Akishima, JP;

Mamoru Mita, Hitachi, JP;

Norio Okabe, Hitachi, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/348 ; H01L 2/352 ; H01L 2/940 ;
U.S. Cl.
CPC ...
H01L 2/348 ; H01L 2/352 ; H01L 2/940 ;
Abstract

In a semiconductor device having a three-layered buffer layer comprising core layer having interconnected foams such as a three-dimensional reticular structure and adhesive layers provided on both sides of the core layer as a stress buffer layer between semiconductor chip and wiring to lessen a thermal stress generated between the semiconductor device and the package substrate, where a thickness ratio of core layer to total buffer layer is at least 0.2, the production process can be simplified by using such a buffer layer, thereby improving the mass production capacity and enhancing the package reliability.


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