The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 13, 2002

Filed:

Oct. 03, 2000
Applicant:
Inventors:

Satoru Satake, Tokyo, JP;

Hideki Sakaki, Hiroshima, JP;

Akira Orihashi, Hiroshima, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B07B 1/28 ;
U.S. Cl.
CPC ...
B07B 1/28 ;
Abstract

The invention provides a method for exchanging a plurality of sifter frames of a plan sifter. The steps of the method include a step, when taking out a number of sifter frames from a sifting chamber, of taking out a plurality of sifter frames in a unitary state with the unitary state being maintained to the outside of the machine frame, and a step, when accommodating new sifter frames in the sifting chamber, of stacking the sifter frames outside the machine frame and accommodating the unitary formed sifter frames in the sifting chamber. According to the method of the invention, the sifter frame exchange operation can be carried out in such a way as to reduce heavy labor and risk to workers, and such exchanging operation can be carried out in an easy manner.


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