The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 06, 2002

Filed:

Aug. 04, 1999
Applicant:
Inventors:

Jin-Fuw Lee, Yorktown Heights, NY (US);

Daniel Lawrence Ostapko, Mahopac, NY (US);

Jeffrey Paul Soreff, Poughkeepsie, NY (US);

Chak-Kuen Wong, Shatin, HK;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

Methods and apparatus for use in signal timing analysis with respect to a circuit having at least one gate are provided. In one aspect, the invention includes the step of determining a first constraint slew sensitivity value and a second constraint slew sensitivity value for the at least one gate according to a specified bounding technique. Then, a representative signal for the gate is computed in accordance with the first and second values including an arrival time and slew rate, wherein the representative signal bounds signal paths by bounding a maximum slew sensitivity path and a minimum slew sensitivity path. Such a representative signal may be computed for a worst case late-mode analysis and/or a best case early-mode analysis. The bounding technique may be selected by a user at the time the user inputs the schematic of the circuit on which timing analysis is to be performed. The invention provides for the use of bounding techniques such as, for example, maximum slew, minimum slew, half envelope, full envelope, modified half envelope, modified max slew, modified min slew, least upper bound, and greatest lower bound. The invention may preferably be employed in accordance with static timing analysis associated with VLSI circuit design.


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