The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 30, 2002
Filed:
Apr. 21, 2000
Satoru Satake, Tokyo, JP;
Manabu Ikeda, Hiroshima, JP;
Satoru Takashita, Hiroshima, JP;
Takahiro Doi, Hiroshima, JP;
Satake Corporation, Tokyo, JP;
Abstract
A quality evaluation method for granular objects includes the steps of: irradiating objects from a front side and a back side; taking a reflection light image and a transmission light image from both the front and back sides of the objects; obtaining optical information of the objects by image-processing the reflection and transmission light images; obtaining shape information of the objects based on the optical information; determining the quality of each of the objects based on the optical information and the shape information; and counting the numbers of objects per quality and obtaining ratios of the objects per quality against the total number of objects. The data from the front and the back sides of the granular object are analyzed to enhance the precision of the results of the quality analysis, and in particular, to enhance the precision in detecting cracks.